User: Guest  Login
If you experience problems opening the document, please try this link.
Document type:
Zeitschriftenaufsatz
Author(s):
Malecki, Andreas; Eggl, Elena; Schaff, Florian; Potdevin, Guillaume; Baum, Thomas; Garcia, Eduardo Grande; Bauer, Jan S.; Pfeiffer, Franz
Title:
Correlation of X-Ray Dark-Field Radiography to Mechanical Sample Properties
Journal title:
Microscopy and Microanalysis
Year:
2014
Journal volume:
20
Journal issue:
05
Pages contribution:
1528-1533
Fulltext / DOI:
doi:10.1017/S1431927614001718
E-ISSN:
1435-8115
Notes:
Dieser Beitrag ist mit Zustimmung des Rechteinhabers aufgrund einer (DFGgeförderten) Allianz- bzw. Nationallizenz frei zugänglich. This publication is with permission of the rights owner freely accessible due to an Alliance licence and a national licence (funded by the DFG, German Research Foundation) respectively
 BibTeX